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LCD Conductive Particle Inspection Microscope MX8RT
The LCD conductive particle inspection microscope MX8RT adopts a new illumination system and optical system of the research grade microscope RX series
Product details
LCD Conductive Particle Inspection MicroscopeMX8RTuseThe groundbreaking design of the Daikin camera stand can support an 8-inch large work platform, and the stable and innovative mechanical structure better meets the needs of the professional market.
Bright field observation (transmission)
5W high-power LED, equipped with N.A.0.5 spotlight, can observe LCD color display screens, device frame edges, etc. under transparent illumination.
Transmitting illumination and reflecting illumination are independently controlled, which can be lit simultaneously or separately.
LCD 10X Transmitting Light
Bright field observation (reflection)
The telecentric reflection illumination system, coupled with a newly designed infinite far-field achromatic long working distance metallographic objective, can obtain clear, flat, and bright high-quality microscopic images from low magnification to high magnification.
Integrated Circuit 5X Bright Field Integrated Circuit 100X Bright Field
Simple polarization observation
Insert the polarizer mirror and analyzer card into the designated position of the illumination to perform simple polarization observation. The analyzer can be divided into two types: fixed and 360 ° rotating.
PCB cross-section 20X polarized light
Dark field observation
Pull the dark field lighting lever to the designated position to use the dark field function, which can observe various scratches, impurities, and other subtle defects on the surface of objects. The dark field function is limited to the MX8R model.
FPC 10X dark field
DIC differential interferometry observation
On the basis of orthogonal polarization, inserting a DIC prism allows for DIC differential interference phase contrast observation. By using DIC technology, the slight height difference on the surface of the objective lens can produce a significant relief effect, greatly improving the contrast of the image.
5X, 10X, and 20X are designed specifically for DIC, ensuring consistent interference across the entire field of view and excellent differential interference effects. High magnification objective lenses also have good DIC effects.
Conductive particles 20X DIC wafer 50X DIC
Product dimension diagram
LCD Conductive Particle Inspection Microscope MX8RT Configuration Parameters
Optical system |
Infinite chromatic aberration optical system |
Observation method |
Bright field/Dark field/Polarization/DIC |
Observation tube |
30 ° tilt, positive image, infinite hinge three-way observation tube, distance adjustment: 50-76mm, spectral ratio: 100:0 or 0:100 |
30 ° tilt, inverted image, infinite distance hinge three-way observation head, distance adjustment range 50-76mm, three level spectral ratio: 0:100 or 20:80 or 100:0 | |
Eyepiece |
High eye point, large field of view, flat field eyepiece PL10X/25mm, adjustable visual acuity, with a single scale cross reticle |
High eye point, large field of view, flat field eyepiece PL10X/26.5mm, adjustable visual acuity, with a single scale cross reticle | |
Objective lens |
Semi destructive metallographic objective lens with bright and dark fields (5X, 10X, 20X, 50X, 100X) |
Infinite working distance flat field bright dark field achromatic metallographic objective lens (5X, 10X, 20X, 50X, 100X) | |
Converter |
Light dark field five hole converter with DIC slot |
Bright dark field, bright field six hole converter with DIC slot | |
Mingchang seven hole converter with DIC slot | |
Focusing mechanism |
Reflective rack, front low hand position coarse and micro coaxial focusing mechanism. Coarse adjustment stroke of 33mm, fine adjustment accuracy of 0.001mm; equipped with anti slip adjustment elastic device and random upper limit device; Built in 100-240V wide voltage system with brightness setting, dark knob and reset button |
Bright and dark field reflector with variable aperture stop, field stop, adjustable center; Equipped with a light dark field lighting switching device; Slot with color filter and polarizing device | |
Carrier platform |
8-inch three-layer mechanical mobile platform, with coaxial adjustment in the X and Y directions at low hand positions; Platform area 525mmx330mm, movement range: 210mmx210mm; equipped with clutch handle, can be used for rapid movement within the full range of travel; Glass loading platform, (for reflection) |
Reflective lighting system |
Bright and dark field reflector with variable aperture stop, field stop, adjustable center; Equipped with a light dark field lighting switching device; Slot with color filter and polarizing device |
Photography and videography |
0.5X/0.65X/1X camera adapter, C-type interface, adjustable focus |
Other |
Polarizing mirror insert board, fixed analyzer insert board, 360 ° rotating analyzer insert board; DIC differential interference component; Interference filter group for reflection; High precision micrometer |
Photo effect of LCD conductive particle inspection microscope:
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